| dc.contributor.author | Kaushalya, W A D A | |
| dc.contributor.author | Rathnayake, Y P G S K | |
| dc.contributor.author | Sampath, D A I U | |
| dc.contributor.author | Chandrathilaka, B M M K | |
| dc.contributor.author | Weerarathna, R S | |
| dc.contributor.author | Rathnayake, R M N M | |
| dc.date.accessioned | 2024-07-08T06:02:55Z | |
| dc.date.available | 2024-07-08T06:02:55Z | |
| dc.date.issued | 2024-05-31 | |
| dc.identifier.issn | 2513-2733 | |
| dc.identifier.uri | http://digitalrepository.cipmlk.org/handle/1/141 | |
| dc.description.abstract | This research investigates the Mental Health (MH) and well-being of Information Technology Professionals (ITPs) working in Sri Lankan (SL) software companies. A qualitative approach was adopted, involving interviews with 28 ITPs to explore their experiences and perspectives. Thematic analysis revealed significant insights, including the prevalence of workload-related stressors such as tight deadlines and task complexity, the importance of social support from colleagues and supervisors, the role of transparent communication channels and supportive organizational policies, and the influence of stress on mental well-being. Coping strategies varied among participants, with seeking social support being prominent. Despite challenges, many participants expressed job satisfaction, highlighting positive aspects of their workplaces. These findings underscore the complexity of the workplace environment and emphasize the need for holistic approaches to promote MH and well-being in the software industry. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Chartered Institute of Personnel Management | en_US |
| dc.relation.ispartofseries | 8th;00058_P24 | |
| dc.relation.uri | https://ror.org/05g7w4342 | |
| dc.subject | IT Professionals, Mental Health, Perceptions, Software Companies, Well-being, Work Environment | en_US |
| dc.title | Unlocking Happiness: How Work Environment Influence Mental Health of IT Professionals in Sri Lanka | en_US |
| dc.type | Article | en_US |